China Suppliers Factory of High-Purity 300mm Tungsten Titanium Alloy Target for Advanced Manufacturing
WTi films have a very low diffusion coefficient, which effectively prevents the diffusion of copper (Cu) atoms to the silicon substrate or dielectric layer in advanced interconnect processes.
The active properties of Ti significantly improve the bonding strength of the film with substrates like SiO₂ and low-k media, as well as upper metals like Cu, which inhibits film peeling.
The optimized grain boundary structure makes the film resistivity lower than that of pure TiN and other compounds, reducing the resistance of the interconnect line.
Sputtering stability is maintained through a uniform alloy phase structure, high sputtering rates, and optimized grain size/microstructure which reduces particle spatter and abnormal discharge.
Yes, in the high-temperature environment of a PVD cavity (300-500°C), WTi film maintains structural stability and inhibits performance degradation caused by oxidation.
WTi films offer flexible process compatibility. They are compatible with Ta/TaN, Co, Ru, and other film materials, supporting complex laminated structure design and reaction sputtering in mixed nitrogen/argon atmospheres.




